The Zygo laser interferometer is renowned in the optical inspection field for its exceptional precision and reliability. By utilizing the Zygo laser interferometer, Bena Optics can achieve sub-nanometer level surface measurements and wavefront analysis, ensuring that each optical component meets the highest quality standards. This advanced inspection technology allows Bena Optics to quickly identify and correct even the smallest manufacturing defects, continuously optimizing production processes to enhance product consistency and performance. This rigorous quality management control system enables Bena Optics to stand out in the highly competitive optical market, earning the trust and praise of its customers.
High Precision:Achieves sub-nanometer level surface measurements and wavefront analysis.Reliability:Provides stable and consistent inspection results.Quick Defect Identification:Rapidly detects and corrects minor manufacturing defects.Production Optimization:Continuously improves production processes, enhancing product consistency and performance.
Quality Assurance:Ensures each optical component meets the highest quality standards
With its ultra-high precision and excellent dynamic performance, the CMM is particularly suitable for fast data acquisition and high-speed scanning technologies, thereby increasing the efficiency of process control.
High-Precision Geometric Measurement;
Surface Quality Assessment;
Complex Surface Measurement;
Automated and Efficient Inspection;
Data Analysis and Reporting;
Non-Contact Measurement.
The centering instrument is a critical tool in the optical inspection process, offering unparalleled accuracy in aligning optical components. At Bena Optics, the use of advanced centering instruments ensures that each lens and optical element is perfectly aligned, minimizing aberrations and maximizing performance. This precision alignment capability allows Bena Optics to produce high-quality optical systems with superior image clarity and consistency. By integrating centering instruments into our rigorous quality control processes, Bena Optics demonstrates its commitment to excellence and its ability to meet the most demanding optical standards, thereby reinforcing our reputation as a leader in the optical industry.
LuphoScan Measurement platform is an interferometric scanning measurement system based on Multi-wavelength interference technology (MWLI). LUPHO Scan is a measurement device based on MWLI method technology (multi-wavelength interferometer). Designed for precision non-contact 3D shape measurement of rotationally symmetric optical components such as aspherical lenses, it is possible to measure the true shape of 3D optical components at the nanoscale. It is designed for precision non-contact 3D shape measurement of rotationally symmetric surfaces, such as aspherical optical lenses. The LuphoScan platform enables easy measurement of aspherics, spheres, planes and free-form surfaces. The main features of the instrument include high speed measurement, high flexibility measurement of special surfaces (e.g., contours of inflection points or flat cusps). Thanks to the multi-wavelength Interference Technology (MWLI) sensor technology, various surface types such as transparent materials, metal parts and abrasive surfaces can be scanned. High-speed non-contact 3D optical surface shape measuring instrument/profiler capable of measuring 120/260/420/600mm diameter optical components. Main application field LuphoScan measurement systems are used to measure the 3D topologies of rotatable symmetric surfaces, such as concave spherical lenses and convex spherical lenses. The measuring table is designed to ensure that most lenses are measured without any spherical deviation, rare top shape (flat head), tilt, or emission point diagram. In addition to standard measurement applications, LuphoScan, the special extension tool of the LuphoScan measurement platform, can also be used to measure a variety of optical element features. The tool can assist in measuring lens thickness, wedge and eccentricity errors. In addition, additional add-on software types enable direct measurement of discontinuous lenses, such as segmented surfaces including rectangular components, annular lenses, surfaces with diffraction steps, and conical lenses.
Focal Length ¢ration measuring instrument for the measurement of focal length and centration of specific lens focal lengths. The laser radar dual lens focal length can be measured simultaneously.
Main uses:
1. Effective focal length measurement.
2. Transmission/reflection eccentricity measurement.
3. Curvature radius/rear focal intercept (equipped with grating ruler).
4.MTF measurement.
Electronic autocollimators are primarily used for the following measurement tasks:
• Smallest angle measurement
• Ultra-precise angle adjustment and calibration
• Quality assurance of machine tools and their components
• Assembly automation
• Angle position monitoring
Autocollimators are optical measuring devices that can measure the smallest changes in the angular position of optical reflectors. In the case of electronic autocollimators, the autocollimation image is detected by means of CCD lines or a matrix sensor.
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