LUPHOScan Profilometer for Optical Lenses Inspection

The LUPHOScan HD measurement platform is an interferometric scanning measurement system based on Multi-Wavelength Interferometry (MWLI®) technology.

It is designed for ultra-precise, non-contact 3D shape measurement of rotationally symmetric surfaces, such as aspheric, spherical, planar, and freeform optical lenses.

Key features of this instrument include high-speed measurement, high flexibility in measuring special surfaces (e.g., contours of inflection points or flat tips), and the ability to measure objects with a maximum diameter of up to 420 mm.

Innovative Measurement Technology

The LUPHOScan HD measurement platform pioneers a new realm of high-precision metrology for optical surfaces. The new generation measurement system can measure object angles up to 90°, with absolute measurement accuracy better than ±50 nm (3σ). The measurement results exhibit extremely high repeatability and low noise.

The all-new LUPHOScan HD is the ideal choice for applications with extremely high precision requirements and is fundamental for production process control. It can measure surfaces with extremely high slopes, surfaces with different spacing directions, and extremely small surfaces such as smartphone lens molds.

Measuring Shape Errors of Optical Components with LUPHOSwap Extension

The LUPHOScan 260 HD and LUPHOScan 420 HD measurement platforms can utilize the LUPHOSwap extension to continuously measure all features of both surfaces of a lens. A special measurement concept allows the correlation of measurement results from both surfaces. This concept enables LUPHOSwap to determine the precise thickness, wedge angle, decentering error, and rotational positioning of both surfaces while measuring shape errors.

• In-depth analysis of any rotationally symmetric surface: aspheric, spherical, planar, and freeform.

• High precision: Capable of measuring objects with slopes up to 90°, making it ideal for measuring large, steep, and extremely small aspheric lenses (such as smartphone lens molds).

• Material versatility: Can measure any material, including transparent, mirrored, opaque, polished, and ground surfaces.

• Large spherical deviations: Capable of measuring disk or gull-wing surfaces, as well as the contours of inflection points.

• High repeatability of measurement results: Optimal stability in determining Power and PV parameters.

• Low system noise: Robust and unaffected by environmental changes.

• High-speed measurement: Capable of measuring diameters up to 420 mm.

Bena Optics Currently Possesses a Luphoscan 420HD

Bena Optics currently possesses a Luphoscan 420HD, which can precisely inspect various parameters of optical components. This is particularly advantageous for inspecting the overall surface shape of optical domes, significantly outperforming standard Zygo interferometers.